“Torsional tapping” atomic force microscopy using T-shaped cantilevers
نویسندگان
چکیده
Nic Mullin, Cvetelin Vasilev, Jaimey D. Tucker, C. Neil Hunter, Christa H. M. Weber, and Jamie K. Hobbs Department of Physics and Astronomy, University of Sheffield, The Hicks Building, Hounsfield Road, Sheffield, South Yorkshire S3 7RH, United Kingdom Department of Molecular Biology and Biotechnology, University of Sheffield, Firth Court, Western Bank, Sheffield, South Yorkshire S10 2TN, United Kingdom Department of Chemistry, University of Sheffield, Sheffield, South Yorkshire S3 7HF, United Kingdom
منابع مشابه
Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements.
Torsional harmonic cantilevers allow measurement of time-varying tip-sample forces in tapping-mode atomic force microscopy. Accuracy of these force measurements is important for quantitative nanomechanical measurements. Here we demonstrate a method to convert the torsional deflection signals into a calibrated force wave form with the use of nonlinear dynamical response of the tapping cantilever...
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